Metrology and Measurement Systems is a peer-reviewed english-language open-access journal published by Polish Academy of Sciences in Poland, operating under an open-access model since 2010. The journal covers Technology.
Authors publish in Metrology and Measurement Systems without paying any article processing charge (APC) — making it a fully diamond/platinum open-access venue, supported entirely by its publisher or sponsor. Articles are released under the CC BY-NC-ND license (see other journals using this license).
Keywords
metrology, measurements, sensors, transducers, instruments, measurement methods
At a glance
- Publisher
- Polish Academy of Sciences
- Country
- Poland
- Primary language
- English
- License
- CC BY-NC-ND
- Peer review
- Anonymous peer review
- OA since
- 2010
ISSN
- electronic
- 2300-1941
Frequently asked questions
Is Metrology and Measurement Systems peer-reviewed?
Yes — Metrology and Measurement Systems operates a Anonymous peer review review process.
Does Metrology and Measurement Systems charge an article processing charge (APC)?
No. Metrology and Measurement Systems does not charge any APC. Publication is free for accepted authors.
What subjects does Metrology and Measurement Systems publish?
Metrology and Measurement Systems publishes research in Technology.
What languages does Metrology and Measurement Systems accept?
Metrology and Measurement Systems accepts manuscripts in English.
What is the ISSN of Metrology and Measurement Systems?
ISSN:
2300-1941 (electronic).How do I submit a manuscript to Metrology and Measurement Systems?
Submit through the journal's official portal: visit submission page →