Journal of Applied Research in Electrical Engineering is a peer-reviewed english-language open-access journal published by Shahid Chamran University of Ahvaz in Iran, Islamic Republic of, operating under an open-access model since 2021. The journal covers Electrical engineering. Electronics. Nuclear engineering.
Authors publish in Journal of Applied Research in Electrical Engineering without paying any article processing charge (APC) — making it a fully diamond/platinum open-access venue, supported entirely by its publisher or sponsor. Articles are released under the CC BY-NC license (see other journals using this license).
Keywords
electrical engineering, electronics, power engineering, control engineering, telecommunications
At a glance
- Publisher
- Shahid Chamran University of Ahvaz
- Country
- Iran, Islamic Republic of
- Primary language
- English
- License
- CC BY-NC
- Peer review
- Anonymous peer review
- OA since
- 2021
ISSN
- 2717-414X
- electronic
- 2783-2864
Frequently asked questions
Is Journal of Applied Research in Electrical Engineering peer-reviewed?
Yes — Journal of Applied Research in Electrical Engineering operates a Anonymous peer review review process.
Does Journal of Applied Research in Electrical Engineering charge an article processing charge (APC)?
No. Journal of Applied Research in Electrical Engineering does not charge any APC. Publication is free for accepted authors.
What subjects does Journal of Applied Research in Electrical Engineering publish?
Journal of Applied Research in Electrical Engineering publishes research in Electrical engineering. Electronics. Nuclear engineering.
What languages does Journal of Applied Research in Electrical Engineering accept?
Journal of Applied Research in Electrical Engineering accepts manuscripts in English.
What is the ISSN of Journal of Applied Research in Electrical Engineering?
ISSN:
2717-414X (print) · 2783-2864 (electronic).How do I submit a manuscript to Journal of Applied Research in Electrical Engineering?
Submit through the journal's official portal: visit submission page →